Atomic-scale surface structure determination: Comparison of techniques

Surface and Interface Analysis

Volumn 28, Issue 1, 1999, Pages 36-43

  Van Hove, Michel A ^a,b,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; LOW ENERGY ELECTRON DIFFRACTION; PHASE INTERFACES; SCANNING TUNNELING MICROSCOPY; X RAY CRYSTALLOGRAPHY;

ATOMIC-SCALE SURFACE STRUCTURE; ION SCATTERING;

SURFACE STRUCTURE;

EID: 0032643750     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199908)28:1<36::AID-SIA614>3.0.CO;2-1     Document Type: Article

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