Surface structure determination by STM vs Leed

Progress in Surface Science

Volumn 54, Issue 3-4, 1997, Pages 315-329

  Van Hove, M A ^a   Cerda, J ^a   Sautet, P ^b,c   Bocquet, M L ^b,c   Salmeron, M ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b INST DE RECHERCHES SUR LA CATALYSE   (France)

^c UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRONIC STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY;

SURFACE STRUCTURE DETERMINATION;

SURFACE STRUCTURE;

EID: 0031094927     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0079-6816(97)00011-7     Document Type: Article

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