Estimating the economic benefits of DFT

IEEE Design and Test of Computers

Volumn 16, Issue 1, 1999, Pages 71-79

  Butler, Kenneth M ^a,b,c  

^a TEXAS INSTRUMENTS   (United States)

^b IEEE   (United States)

^c IEEE ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

REVENUE RETURNS;

COSTS; DESIGN; ECONOMICS; TESTING;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0032632946     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.748807     Document Type: Article

References (13)

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