Testing the 400 MHz IBM generation-4 CMOS chip

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 106-114

  Foote, Thomas G ^a   Hoffman, Dale E ^a   Huott, William V ^a   Koprowski, Timothy J ^a   Robbins, Bryan J ^a   Kusko, Mary P ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS;

AUTOMATIC TEST PATTERN GENERATION (ATPG);

INTEGRATED CIRCUIT TESTING;

EID: 0031341136     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)