A BIST and boundary-scan economics framework

IEEE Design and Test of Computers

Volumn 14, Issue 3, 1997, Pages 17-23

  Miranda, José M ^a,b,c,d  

^a NOKIA RESEARCH CENTER   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c BOSTON UNIVERSITY   (United States)

^d UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER ARCHITECTURE; COMPUTER DEBUGGING; COST EFFECTIVENESS; ERROR CORRECTION; HIERARCHICAL SYSTEMS; INDUSTRIAL ECONOMICS; INTEGRATED CIRCUIT LAYOUT;

BOUNDARY SCAN; BUILT IN SELF TEST (BIST); DESIGN FOR TESTABILITY (DFT); FAILURE MODE ANALYSIS (FMA); IN CIRCUIT TESTING (ICT);

INTEGRATED CIRCUIT TESTING;

EID: 0031191267     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.605988     Document Type: Article

References (8)

1. IEEE Std 1149.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture (includes IEEE Std 1149.1a-1993), IEEE, Piscataway, N.J., 1993.
2. V. Agrawal, ed., M. Abadir, and A.P. Ambler, guest eds., "Special Issue on Economics of Electronic Design, Manufacture and Test," J. Electronic Testing: Theory and Applications, May/Aug. 1994.
3. B. Johnson, "Boundary Scan Eases Test of New Technologies," Test and Measurement Europe, Autumn 1993.
4. A.P. Ambler et al., "The Economics of Design for Test: Applications Clarify the Cost of Test," Evaluation Engineering, Nov. 1994, pp. 22, 23, 26.
5. E.C. Behnke, "3B21D BIST/Boundary-Scan System Diagnostic Test Story," Proc. 1994 Int'l Test Conf., IEEE Computer Society Press, Los Alamitos, Calif., 1994, pp. 120-126.
6. J. West, "Cray Research Beats the Market with Boundary-Scan," Windows, A Teradyne Quarterly Publication, Vol. 8, No. 3, Fall 1995, pp. 2-4.
7. W. Ke, "Backplane Interconnect Test in a Boundary-Scan Environment," Proc. 1996 Int'l Test Conf., IEEE CS Press, 1996, pp. 717-724.
8. B.C. Cole, "Getting to the Market on Time," Electronics, Apr. 1989, pp. 62-66.