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Journal of Applied Physics

Volumn 86, Issue 6, 1999, Pages 3048-3063

Forces between cavities and dislocations and their influence on semiconductor microstructures

(2) Myers, S M a Follstaedt, D M a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; STRAIN; SURFACE TENSION;

EDGE DISLOCATIONS; SCREW DISLOCATIONS; SEMICONDUCTOR MICROSTRUCTURES;

SEMICONDUCTOR MATERIALS;

EID: 0032621247 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.371167 Document Type: Article

Times cited : (19)

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