High-sensitivity intracavity laser absorption spectroscopy with vertical-external-cavity surface-emitting semiconductor lasers

Optics Letters

Volumn 24, Issue 12, 1999, Pages 826-828

  Garnache, A ^a   Kachanov, A A ^a   Stoeckel, F ^a   Planel, R ^b  

^a Lab de Spectrométrie Phys   (France)

^b Lab Microstructures Microlectron   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CONTINUOUS WAVE LASERS; HIGH POWER LASERS; LASER APPLICATIONS; OPTICAL PUMPING; SEMICONDUCTOR QUANTUM WELLS; SIGNAL TO NOISE RATIO;

INTRACAVITY LASER ABSORPTION SPECTROSCOPY (ICLAS); VERTICAL-EXTERNAL-CAVITY SURFACE-EMITTING SEMICONDUCTOR LASERS;

QUANTUM WELL LASERS;

EID: 0032620150     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.24.000826     Document Type: Article

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