Photon emission and related hot-carrier effects in polycrystalline silicon thin-film transistors

Journal of Applied Physics

Volumn 85, Issue 9, 1999, Pages 6917-6919

  Farmakis, F V ^a   Dimitriadis, C A ^a,c   Brini, J ^a   Kamarinos, G ^a   Gueorguiev, V K ^b   Ivanov, Tz E ^b  

^a Grenoble INP Phelma   (France)

^b INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^c ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; HOLE TRAPS; HOT CARRIERS; LEAKAGE CURRENTS; LIGHT EMISSION; PHOTONS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON;

HOT-CARRIER EFFECTS;

THIN FILM TRANSISTORS;

EID: 0032619853     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370105     Document Type: Article

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