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Volumn 83, Issue 2, 1998, Pages 786-792
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Intrinsic strain in SiO2 thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 4444307840
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.366759 Document Type: Article |
Times cited : (40)
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References (25)
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