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Volumn 82, Issue 12, 1997, Pages 6041-6046
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Investigation of substrate-dependent nucleation of plasma-deposited microcrystalline silicon on glass and silicon substrates using atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
FILM GROWTH;
GLASS;
MORPHOLOGY;
NUCLEATION;
PHASE TRANSITIONS;
PLASMA APPLICATIONS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
ROUGHNESS MEASUREMENT;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
AMORPHOUS STRUCTURE;
MICROCRYSTALLINE SILICON;
SUBSTRATE DEPENDENT NUCLEATION;
SEMICONDUCTING SILICON;
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EID: 0031343410
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.366471 Document Type: Article |
Times cited : (11)
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References (24)
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