Infrared-ellipsometry evidence of disorder-induced vibrational frequency shifts in hydrogenated-amorphous-silicon thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 15, 1996, Pages 10530-10542

  Ossikovski, R ^a   Drevillon B ^a  

^a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003231081     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.10530     Document Type: Article

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