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Volumn 69, Issue 22, 1996, Pages 3312-3314
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Nonoptical tip-sample distance control for scanning near-field optical microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
OPTICAL FIBERS;
OSCILLATIONS;
PHOTORESISTS;
PIEZOELECTRIC DEVICES;
PIEZOELECTRICITY;
RELAXATION PROCESSES;
SIGNAL TO NOISE RATIO;
SURFACES;
TIME DIVISION MULTIPLEXING;
VOLTAGE MEASUREMENT;
FIBER TIP;
QUARTZ TUNING FORK;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
TIP SAMPLE DISTANCE;
OPTICAL MICROSCOPY;
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EID: 0030289894
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.117290 Document Type: Article |
Times cited : (18)
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References (14)
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