A novel ultrasonic resonance sample-tip distance regulation for near field optical microscopy and shear force microscopy

Solid State Communications

Volumn 98, Issue 7, 1996, Pages 661-664

  Zhu, X ^a   Huang, G S ^a   Zhou, H T ^a   Dai, Y D ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

A. nanostructures; C. scanning probe microscopy; D. optical properties; D. piezoelectricity

Indexed keywords

MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; NATURAL FREQUENCIES; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; PHASE SHIFT; PIEZOELECTRICITY; RESONANCE; ULTRASONICS;

PIEZOELECTRIC QUARTZ FORK; SAMPLE TIP DISTANCE REGULATION; SHEAR FORCE MICROSCOPY; ULTRASONIC RESONANCE;

ULTRASONIC APPLICATIONS;

EID: 0030150196     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(95)00787-3     Document Type: Article

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