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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 146, Issue 1-4, 1998, Pages 393-398

Scanning force microscopy of heavy-ion tracks in lithium fluoride

(4) Muller A a Neumann, R a Schwartz, K a Trautmann, C a

a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; CRYSTAL LATTICES; GOLD; HEAVY IONS; LITHIUM COMPOUNDS; MICROSCOPIC EXAMINATION; NICKEL; RADIATION DAMAGE; SINGLE CRYSTALS; URANIUM;

ION ENERGY LOSS; LITHIUM FLUORIDE; SCANNING FORCE MICROSCOPY;

ION BOMBARDMENT;

EID: 0032477088 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(98)00475-3 Document Type: Article

Times cited : (40)

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