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Volumn 43, Issue C, 1995, Pages 335-381

Chapter 9 Cd1-xZnxTe Spectrometers for Gamma and X-Ray Applications

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM ALLOYS; GAMMA RAYS; SEMICONDUCTOR ALLOYS; ZINC ALLOYS; ZINC METALLOGRAPHY;

EID: 77957005958     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)62748-9     Document Type: Chapter
Times cited : (93)

References (81)
  • 15
    • 0001647272 scopus 로고
    • EMIS Data Reviews
    • P. Capper INSPEC London Series No. 10
    • Doty, F.P., EMIS Data Reviews. Capper, P., (eds.) Properties of Narrow Gap Cd-Based Compounds, 1994, INSPEC, London, 540 Series No. 10.
    • (1994) Properties of Narrow Gap Cd-Based Compounds , pp. 540
    • Doty, F.P.1
  • 25
    • 85023498131 scopus 로고
    • Presentation at the 1994 Symposium on Radiation Measurements and Applications
    • B. Glick, E. Eissler, K. Parnham, S. Cameron, 1994, Presentation at the 1994 Symposium on Radiation Measurements and Applications.
    • (1994)
    • Glick, B.1    Eissler, E.2    Parnham, K.3    Cameron, S.4
  • 41
    • 85023509358 scopus 로고
    • Japanese patent 87–17 5969
    • T. Kotani, M. Tatsumi, 1987, Japanese patent 87–17 5969.
    • (1987)
    • Kotani, T.1    Tatsumi, M.2
  • 53
    • 85023548867 scopus 로고
    • X-Ray Detector Physics and Applications
    • SPIE Bellingham, WA.
    • Polichar, R.M., Schirato, R.C., Reed, J.H., X-Ray Detector Physics and Applications. Proc. of the SPIE, 43, 1992, SPIE, Bellingham, WA., 1736.
    • (1992) Proc. of the SPIE , vol.43 , pp. 1736
    • Polichar, R.M.1    Schirato, R.C.2    Reed, J.H.3
  • 72
  • 80
    • 0001347491 scopus 로고
    • R.K. Willardson A.C. Beer Academic Press New York.
    • Zanio, K., Willardson, R.K., Beer, A.C., (eds.) Semiconductors and Semimetals, 13, 1978, Academic Press, New York., 103.
    • (1978) Semiconductors and Semimetals , vol.13 , pp. 103
    • Zanio, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.