SCOPUS 정보 검색 플랫폼

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3115, Issue , 1997, Pages 40-50

Analysis of Cd1-xZnxTe microstructure

(5) Heffelfinger, J R a Medlin, Doug L a Yoon, H a Hermon, H a James, R B a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

CdZnTe; Electron microscopy; Gamma ray detectors; Inclusions; Microstructure

Indexed keywords

CRACKS; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; ENERGY DISPERSIVE SPECTROSCOPY; GAMMA RAY SPECTROMETERS; GRAIN BOUNDARIES; INCLUSIONS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SPECTRUM ANALYSIS; THERMAL STRESS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH-PRESSURE BRIDGEMAN (HPB) TECHNIQUES;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0031288439 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.277702 Document Type: Conference Paper

Times cited : (17)

References (12)

1
- 77957005958
- xTe Spectrometers for Gamma and X-Ray Applications
- eds. T. E. Schlesinger and R. B. James, Academic Press
- (1995) Semiconductors and Semimetals , vol.40 , pp. 335-381
- James, R.B.¹ Schlesinger, T.E.² Lund, J.³ Schieber, M.⁴

2
- 0000796416
- Properties of CdZnTe crystals grown by a high pressure Bridgeman method
- (1992) J. Vac. Sci. Technol. B , vol.10 , pp. 1418-1422
- Doty, F.P.¹ Butler, J.F.² Schetzina, J.F.³ Bowers, K.A.⁴

3
- 0027149659
- Improved quality of bulk II-VI substrates for HgCdTe and HgZnTe epitaxy
- (1993) Mat. Res. Soc. Symp. Proc. , vol.302 , pp. 391-401
- Sen, S.¹ Stannard, J.E.²

4
- 0001085695
- Reduction of CdZnTe substrate defects and relation to epitaxial HgCdTe quality
- (1996) J. Electronic Mat. , vol.25 , pp. 1188-1195
- Sen, S.¹ Liang, S.C.² Rhiger, D.R.³ Stannard, J.E.⁴ Arlinghaus, H.F.⁵

5
- 0027656337
- xTe grown by vertical Bridgeman-Stackbarger technique
- (1993) J. Crys. Growth , vol.132 , pp. 250-260
- Shen, J.¹ Aidun, D.K.² Regel, L.³ Wilcox, W.R.⁴

6
- 0027150170
- Crystallographic and metallurgical characterization of radiation detector grade cadmium telluride materials
- (1993) Mat. Res. Soc. Symp. Proc. , vol.302 , pp. 463-478
- Johnson, C.J.¹ Eissler, E.E.² Cameron, S.E.³ Kong, Y.⁴ Fan, S.⁵ Jovanovic, S.⁶ Lynn, K.G.⁷

7
- 0027646327
- Thermomigration of Te precipitates and improvement of (Cd,Zn)Te substrate characteristics for the fabrication of LWIR (Hg,Cd)Te photodiodes
- (1993) J. Electronic Mat. , vol.22 , pp. 1073-1080
- Vydyanath, H.R.¹ Ellsworth, J.A.² Parkinson, J.B.³ Kennedy, J.J.⁴ Dean, B.⁵ Johnson, C.J.⁶ Neugebauer, G.T.⁷ Sepich, J.⁸ Liao, P.K.⁹

8
- 0005366303
- Yield-limiting factors in HPB CdZnTe growth
- unpublished
- (1997) 5th Scientific Symposium on Room-Temperature Semi-Conductor X-ray, Gamma-ray and Neutron Detectors
- Szeles, C.¹

9
- 0001657422
- Recipe to minimize Te precipitation in CdTe and (Cd,Zn)Te crystals
- (1992) J. Vac. Sci. Technol. B , vol.10 , pp. 1476-1484
- Vydyanath, H.R.¹ Ellsworth, J.² Kennedy, J.J.³ Dean, B.⁴ Johnson, C.J.⁵ Neugebauer, G.T.⁶ Sepich, J.⁷ Liao, P.-K.⁸

10
- 84975349619
- Phase Diagram of the Zn-Cd-Te Ternary System
- (1970) J. Electrochem. Soc , vol.117 , pp. 1305-1309
- Steininger, J.¹ Strauss, A.J.² Brebrick, R.F.³

11
- 84955025375
- 0.2Te
- (1985) J. Vac. Sci. Technol. A , vol.3 , pp. 112-115
- Bell, S.L.¹ Sen, S.²

12
- 0026412906
- Typical macroscopic defects in ZnSe crystals grown from the melt
- (1991) J. Crys. Growth , vol.110 , pp. 623-625
- Terashima, K.¹ Takena, M.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.