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Volumn 16, Issue 6, 1998, Pages 3218-3222

Plasma-enhanced chemical vapor deposition of intrinsic microcrystalline silicon from chlorine-containing source gas

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0032332713     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581525     Document Type: Article
Times cited : (10)

References (24)
  • 21
    • 85034276188 scopus 로고    scopus 로고
    • SIMS measurements were performed by Evans East, Plainsboro, NJ 08536
    • SIMS measurements were performed by Evans East, Plainsboro, NJ 08536.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.