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Volumn 45, Issue 6 PART 1, 1998, Pages 2849-2856

Alpha particle, proton and x-ray damage in fully depleted pn-junction ccd detectors for x-ray imaging and spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; CHARGE COUPLED DEVICES; CHARGE TRANSFER; ELECTRON TRAPS; POINT DEFECTS; PROTON IRRADIATION; RADIATION DAMAGE; RADIATION HARDENING; SEMICONDUCTING SILICON; SEMICONDUCTOR JUNCTIONS; THERMAL EFFECTS; X RAY SPECTROSCOPY;

EID: 0032317372     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736538     Document Type: Article
Times cited : (20)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.