Proton damage effects in EEV charge coupled devices

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1344, Issue , 1990, Pages 378-395

  Holland, A ^a   Abbey, A ^a   Lumb, D ^a   McCarthy, K ^a  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ASTROPHYSICS; PROTONS;

EEV CCD;

SEMICONDUCTOR DEVICES, CHARGE COUPLED;

EID: 0025540076     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.23266     Document Type: Conference Paper

References (18)