Photoluminescence scanning near-field optical microscopy on III-V quantum dots

Physica Status Solidi (A) Applied Research

Volumn 170, Issue 2, 1998, Pages 401-410

  Pahlke, D ^a   Poser, F ^a   Steimetz, E ^a   Pristovsek, M ^a   Esser, N ^a   Richter, W ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; LIGHT REFLECTION; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; RAYLEIGH SCATTERING; SCANNING;

PHOTOLUMINESCENCE IMAGES; RAYLEIGH DIFFRACTION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0032298858     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199812)170:2<401::AID-PSSA401>3.0.CO;2-I     Document Type: Article

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