A low-temperature scanning near-field optical microscope for photoluminescence at semiconductor structures

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Manke, I ^a   Pahlke, D ^a   Lorbacher, J ^a   Busse, W ^a   Kalka, T ^a   Richter, W ^a   Dahne Prietsch M ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LOW TEMPERATURES; QUANTUM DOT; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SEMICONDUCTOR STRUCTURE; SPATIALLY RESOLVED;

PHOTOLUMINESCENCE; SEMICONDUCTOR QUANTUM DOTS;

MICROSCOPES;

EID: 0343845765     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051168     Document Type: Article

References (9)

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9. I. Manke, D. Pahlke, J. Lorbacher, F. Poser, F. Heinrichsdorff, A. Krost, D. Bimberg, W. Richter, M. Dähne-Prietsch: to be submitted