Subpicosecond sampling using a noncontact electro-optic probe

Journal of Applied Physics

Volumn 66, Issue 9, 1989, Pages 4001-4009

  Nagatsuma, T ^a   Shibata, T ^a   Sano, E ^a   Iwata, A ^a  

^a NTT CORPORATION   (Japan)

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Indexed keywords

EID: 0000634976     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.344008     Document Type: Article

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