Die level CDM testing duplicates assembly operation failures

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1996, Pages 117-122

  Bernier, Joe ^a   Croft, Gregg ^a  

^a INTERSIL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIES; ELECTRIC DISCHARGES; ELECTROSTATICS; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS;

ELECTROSTATIC DISCHARGE (ESD) FAILURES; FIELD INDUCED CHARGED DEVICE MODEL (FCDM);

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 0030402058     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)