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Volumn , Issue , 1997, Pages 382-385

Field-induced breakdown ESD damage of magnetoresistive recording heads

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC FIELD EFFECTS; ELECTROSTATICS; MAGNETORESISTANCE; SCANNING ELECTRON MICROSCOPY;

EID: 0031362062     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/eosesd.1997.634266     Document Type: Conference Paper
Times cited : (21)

References (7)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.