A Fast Computational Technique for Accurate Permittivity Determination Using Transmission Line Methods

IEEE Transactions on Microwave Theory and Techniques

Volumn 31, Issue 3, 1983, Pages 249-254

  Ligthart, Leo P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

WAVEGUIDES, DIELECTRIC - APPLICATIONS;

TRANSMISSION LINE METHODS;

MICROWAVE MEASUREMENTS;

EID: 0020720426     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.1983.1131471     Document Type: Article

References (4)

1. S. S. Stuchly and M. Matuszewski, “A combined total reflection-transmission method in application to dielectric spectroscopy,” IEEE Trans. Instrum. Meas., vol. IM-27, no. 3, pp. 285–288, Sept. 1978.
2. G. A. Deschamps, “Determination of reflection coefficients and insertion loss of a waveguide junction,” J. of Appl. Phys., vol. 24, no. 8, pp. 1046–1051, Aug. 1953.
3. H. M. Altschuler, Handbook of Microwave Measurements, M. Sucher and J. Fox, Eds. vol. 2. New York: Wiley, section 9.08, 1963.
4. J. B. Horton and G. A. Burdick, “Measurement of dielectric constant and loss tangent in materials having large dielectric constants,” IEEE Trans. Microwave Theory Tech., vol. MTT-16, pp. 873–875, Oct. 1968.