Analytical subthreshold current hump model for deep-submicron shallow-trench-isolated cmos devices

Solid-State Electronics

Volumn 42, Issue 10, 1998, Pages 1871-1879

  Lin, S C ^a   Kuo, J B ^a   Huang, K T ^b   Sun, S W ^b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b UNITED MICROELECTRONICS CORPORATION   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; SEMICONDUCTOR DEVICE MODELS;

SUBTHRESHOLD CURRENT HUMP MODEL;

CMOS INTEGRATED CIRCUITS;

EID: 0032182598     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00161-0     Document Type: Article

References (12)

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