Current spreading and carrier diffusion in long-wavelength vertical-cavity surface-emitting lasers

IEEE Photonics Technology Letters

Volumn 10, Issue 9, 1998, Pages 1202-1204

  Xiong, Yanyan ^a   Lo, Yu Hwa ^a,b  

^a IEEE   (United States)

^b Cornell University   (United States)

Author keywords

Current spreading; Long wavelength lasers; Numerical analysis; VCSEL's; Wafer bonding

Indexed keywords

CURRENT DENSITY; LASER MODES; MIRRORS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

CURRENT CONFINEMENT; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 0032162538     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.705590     Document Type: Article

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