Nanoscale electronic devices on carbon nanotubes

Nanotechnology

Volumn 9, Issue 3, 1998, Pages 153-157

  Collins, Philip G ^a   Bando, Hiroshi ^b   Zettl, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY MEASUREMENT; HETEROJUNCTIONS; NANOTECHNOLOGY; POINT DEFECTS; SCANNING TUNNELING MICROSCOPY;

SINGLE-WALLED CARBON NANOTUBES;

NANOTUBES;

EID: 0032156270     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/9/3/003     Document Type: Article

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