Imaging of local charge density in an InAs/GaAs two-dimensional heterostructure by scanning tunneling microscopy

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 8 PART A, 1998, Pages

  Yamaguchi, Hiroshi ^a   Hirayama, Yoshiro ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

(111)A; GaAs; InAs; Quantum well; Scanning tunneling microscopy; Two dimensional electron gas

Indexed keywords

CARRIER CONCENTRATION; ELECTRON GAS; ELECTRON TUNNELING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; THIN FILMS;

INDIUM ARSENIDE;

HETEROJUNCTIONS;

EID: 0032140923     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l899     Document Type: Article

References (22)

1. M. F. Crommie, C. P. Lutz and D. M. Eigler: Nature 363 (1993) 524.
2. Y. Hasegawa and Ph. Avouris: Phys. Rev. Lett. 71 (1993) 1071.
3. M. F. Crommie, C. P. Lutz, and D. M. Eigler: Science 262 (1993) 218.
4. D. Fujita, K. Amemiya, T. Yakabe, H. Nejoh, T. Sato and M. Iwatsuki: Phys. Rev. Lett. 78 (1997) 3904.
5. P. T. Sprunger, L. Petersen, E. W. Plummer, E. Lægsgaard and F. Besenbacher: Science 275 (1997) 1764.
6. Ph. Hofmann, B. G. Briner, M. Doering, H.-P. Rust, E. W. Plummer and A. M. Bradshaw: Phys. Rev. Lett. 79 (1997) 265.
7. J. Friedel: Nuovo Cimento Suppl. 7 (1958) 287.
8. M. C. M. M. van der Wielen, A. J. A. van Roij and H. van Kempen: Phys. Rev. Lett. 96 (1996) 1075.
9. J. W. G. Wildöer, C. J. P. M. Harmans and H. van Kempen: Phys Rev. B55 (1997) R16013.
10. M. Wolovelsky, Y. Goldstein and O. Millo: Phys. Rev. B 57 (1998) 6274.
11. M. A. Eriksson, R. G. Beck, M. Topinka, J. A. Katine and R. M. Westervelt: Appl. Phys. Lett. 69 (1996) 671.
12. S. H. Tessmer, P. I. Glicofridis, R. C. Ashoori, L. S. Levitov and M. R. Melloch: Nature 392 (1998) 51.
13. H. Yamaguchi, M. R. Fahy and B. A. Joyce: Appl. Phys. Lett. 69 (1996) 776.
14. H. Yamaguchi, J. G. Belk, X. M. Zhang, J. L. Sudijono, M. R. Fahy, T. S. Jones, D. W. Pashley and B. A. Joyce: Phys. Rev. B55 (1997) 1337.
15. H. Yamaguchi and Y. Hirayama: Jpn. J. Appl. Phys. 37 (1998) 1599.
16. V. Heine: Phys. Rev. A138 (1965) 1689.
17. J. Tersoff: Phys. Rev. Lett. 52 (1984) 465.
18. H. Yamaguchi, J. L. Sudijono, B. A. Joyce, T. S. Jones, C. Gatzke and R. A. Stradling: to be published in Phys. Rev. B.
19. G. Tuttle, H. Kroemer, and J. H. English, J. Appl. Phys. 65 (1989) 5239.
20. R. Wiesendanger: Scanning Probe Microscopy & Spectroscopy (Cambridge Univ. Press, 1994) p. 109.
21. J. Massies, P. Devoldere and N. T. Linh: J. Vac. Sci. & Technol. 16 (1979) 1244.
22. I. M. Vitomirov, A. D. Raisanen, A. C. Finnefrock, R. E. Viturro, L. J. Brillson, P. D. Krichner, G. D. Pettit and J. M. Woodall: J. Vac. Sci. & Technol. B10 (1992) 1898.