Atomic force microscopic studies on the growth of self-assembled monolayers on SrTiO3-surfaces

Thin Solid Films

Volumn 327-329, Issue 1-2, 1998, Pages 185-190

  Kropman, Boike L ^a   Blank, Dave H A ^a   Rogalla, Horst ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Atomic force microscopy; Octadecylchlorosilane; Self assembly

Indexed keywords

ATOMIC FORCE MICROSCOPY; COALESCENCE; FILM GROWTH; MICA; MOLECULAR DYNAMICS; MONOLAYERS; MONOMERS; REACTION KINETICS; SILICA; STRONTIUM COMPOUNDS; SUBSTRATES;

OCTADECYLTRICHLOROSILANE (OTS); SELF-ASSEMBLED MONOLAYERS (SAM);

LANGMUIR BLODGETT FILMS;

EID: 0032139871     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00625-7     Document Type: Article

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