Spectroscopic characterisation of self-assembled monolayers of alkylsiloxanes on SrTiO3

Materials Science and Engineering C

Volumn 5, Issue 3-4, 1998, Pages 163-166

  Kropman, Boike L ^a   Blank, Dave H A ^a   Rogalla, Horst ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Alkyltrichlorosilanes; Ellipsometry; Monolayers

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELLIPSOMETRY; INFRARED SPECTROSCOPY; MONOLAYERS; STRONTIUM COMPOUNDS; SUBSTRATES;

ALKYLTRICHLOROSILANES; ANGLE RESOLVED X RAY PHOTOEMISSION SPECTROSCOPY; REFLECTION ABSORPTION INFRARED SPECTROSCOPY;

SILANES;

EID: 0041854310     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(97)00036-2     Document Type: Article

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