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Volumn 411, Issue 1-2, 1998, Pages
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Detailed energetic interactions of adsorbed Si dimers on Si(001)
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Author keywords
Diffusion and migration; Low index single crystal surfaces; Scanning tunneling microscopy; Silicon; Surface defects; Surface diffusion
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Indexed keywords
ADSORPTION;
CHEMICAL BONDS;
CRYSTAL DEFECTS;
DIFFUSION IN SOLIDS;
DIMERS;
SCANNING TUNNELING MICROSCOPY;
SINGLE CRYSTALS;
SUBSTRATES;
SURFACE PHENOMENA;
ATOM-TRACKING SCANNING TUNNELING MICROSCOPY;
LOW INDEX SINGLE CRYSTALS;
SEMICONDUCTING SILICON;
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EID: 0032136294
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(98)00400-2 Document Type: Article |
Times cited : (10)
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References (21)
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