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Volumn 19, Issue 7, 1998, Pages 247-249

Investigation of poly-Si 1-xGe x for dual-gate CMOS technology

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; FABRICATION; GATES (TRANSISTOR); PERFORMANCE; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS;

EID: 0032123912     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.701432     Document Type: Article
Times cited : (24)

References (12)
  • 1
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    • (1996) IEEE Trans. Electron Devices , vol.17 , pp. 103-105
    • Ricco, B.1    Versari, R.2    Esseni, D.3
  • 2
    • 0027614445 scopus 로고
    • Effect of polysilicon depletion on MOSFET I-V characteristics
    • C.-L. Huang, N. D. Arora, A. I. Nasr, and D. A. Bell, "Effect of polysilicon depletion on MOSFET I-V characteristics," Electron. Lett., vol. 29, no. 13, pp. 1208-1209, 1993.
    • (1993) Electron. Lett. , vol.29 , Issue.13 , pp. 1208-1209
    • Huang, C.-L.1    Arora, N.D.2    Nasr, A.I.3    Bell, D.A.4
  • 3
    • 84968199122 scopus 로고
    • Impact of polysilicon depletion in thin oxide MOS technology
    • K. F. Schuegraf, C. C. King, and C. Hu, "Impact of polysilicon depletion in thin oxide MOS technology," VLSI TSA, pp. 86-90, 1993.
    • (1993) VLSI TSA , pp. 86-90
    • Schuegraf, K.F.1    King, C.C.2    Hu, C.3
  • 5
    • 0027839378 scopus 로고
    • + -polycrystalline SiGe gate electrodes
    • + -polycrystalline SiGe gate electrodes," in IEDM Tech. Dig., 1993, pp. 727-730.
    • (1993) IEDM Tech. Dig. , pp. 727-730
    • Kistler, N.1    Woo, J.2
  • 6
    • 0031380675 scopus 로고    scopus 로고
    • An alternative gate electrode material of fully depleted SOI CMOS for low power applications
    • T. C. Hsiao, A. W. Wang, K. Saraswat, and J. C. S. Woo, "An alternative gate electrode material of fully depleted SOI CMOS for low power applications," in Proc. 1997 IEEE Int. SOI Conf., 1997, pp. 20-21.
    • (1997) Proc. 1997 IEEE Int. SOI Conf. , pp. 20-21
    • Hsiao, T.C.1    Wang, A.W.2    Saraswat, K.3    Woo, J.C.S.4
  • 7
    • 0030688678 scopus 로고    scopus 로고
    • High-performance deep submicron MOST's with polycrystalline-(Si,Ge) gates
    • Y. V. Ponomarev, C. Salm, J. Schmitz, P. H. Woerlee, and D. J. Gravesteijn, "High-performance deep submicron MOST's with polycrystalline-(Si,Ge) gates," VLSI TSA, pp. 311-315, 1997.
    • (1997) VLSI TSA , pp. 311-315
    • Ponomarev, Y.V.1    Salm, C.2    Schmitz, J.3    Woerlee, P.H.4    Gravesteijn, D.J.5
  • 8
    • 0030702636 scopus 로고    scopus 로고
    • AC charge centroid model for quantization of inversion layer in n-MOSFET
    • Y.-C. King, H. Fujioka, S. Kamohara, and C. Hu, "AC charge centroid model for quantization of inversion layer in n-MOSFET," VLSI TSA, pp. 245-249, 1997.
    • (1997) VLSI TSA , pp. 245-249
    • King, Y.-C.1    Fujioka, H.2    Kamohara, S.3    Hu, C.4
  • 10
    • 0028482908 scopus 로고
    • Deposition and properties of low-pressure chemical-vapor deposited polycrystalline silicon-germanium films
    • T.-J. King and K. C. Saraswat, "Deposition and properties of low-pressure chemical-vapor deposited polycrystalline silicon-germanium films," J. Electrochem. Soc., vol. 141, no. 8, pp. 2235-2241, 1994.
    • (1994) J. Electrochem. Soc. , vol.141 , Issue.8 , pp. 2235-2241
    • King, T.-J.1    Saraswat, K.C.2
  • 11
    • 84933643121 scopus 로고
    • Solid solubilities of impurity elements in germanium and silicon
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    • Trumbore, F.A.1
  • 12
    • 0028374842 scopus 로고
    • Electrical properties of heavily doped polycrystalline silicon-germanium films
    • Feb.
    • T. J. King, J. P. McVittie, K. C. Saraswat, and J. R. Pfiester, "Electrical properties of heavily doped polycrystalline silicon-germanium films," IEEE Trans. Electron Devices, vol. 41. pp. 228-232, Feb. 1994.
    • (1994) IEEE Trans. Electron Devices , vol.41 , pp. 228-232
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.