CoCrTa intermediate layers on NiAl underlayers for CoCrPt longitudinal thin film magnetic media

IEEE Transactions on Magnetics

Volumn 34, Issue 4 PART 1, 1998, Pages 1582-1584

  Zou, Jie ^a   Laughlin, David E ^a   Lambeth, David N ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Co; Lattice match; NiAl; Substrate bias

Indexed keywords

COBALT ALLOYS; COERCIVE FORCE; COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; LATTICE CONSTANTS; MAGNETIC RECORDING; METALLIC FILMS; METALLOGRAPHIC MICROSTRUCTURE; NICKEL ALLOYS; TEXTURES;

LATTICE MISMATCH;

MAGNETIC FILM STORAGE;

EID: 0032115535     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.706622     Document Type: Article

References (10)

1. J. Daval and R. Randet, "Electron microscopy on high-coercive-force Co-Cr composite films," IEEE Trans. Magn., vol. 6, pp 768-773 (1970)
2. M. A. Parker, J. K. Howard, R. Ahlert, and K. R. Coffey, "Crystallographic structure of CoPtCr/CrV thin films as revealed by cross-section TEM and x-ray pole-figure analysis and its relevance to magnetic properties," J. Appl. Phys., 73, pp. 5560-5562 (1993).
3. Y. Shiroishi, Y. Hosoe, A. Ishikawa, Y. Yahisa, Y. Sugita, H. Suzuki, T. Ohno, and M. Ohura "Magnetic properties and read/write characteristics of Co-Cr-(Pt,Ta)/(Cr-Ti,Cr) thin film media," J. Appl. Phys., 73, pp. 5569-5571 (1993).
4. 10 spin-valve heads and low-noise thin-film disks," IEEE Trans. Magn., vol. 32, pp 3914-3916 (1996)
5. L. Fang and D. N. Lambeth, "New high coercivity cobalt alloy thin film medium structure for longitudinal recording," Appl. Phys. Lett., 65, pp 3137-3139 (1994).
6. L.-L. Lee, D. E. Laughlin, L. Fang, and D. N. Lambeth, "NiAl underloyers for CoCrTa magnetic thin films," IEEE Trans. Magn., vol. 30, pp 3951-3953 (1994)
7. L.-L. Lee, D. E. Laughlin, L. Fang, and D. N. Lambeth, "Effects of Cr intermediate layers on CoCrPt thin film media on NiAl underlayers," IEEE Trans. Magn., vol. 31, pp 2728-2730 (1995)
8. Powder Diffraction Files, International Center for Diffraction Data, 1992,
9. D. E. Laughlin, B. Cheong, Y. C. Feng, D. N., Lambeth, L.-L. Lee, and B. Wong, "The control of microstructural features of thin films for magnetic recording," Scrpt. Metal. Mat., vol. 33, pp 1525-1536 (1995).
10. Y. Deng, D. N. Lambeth, and D. E. Laughlin, "Structural characteristics of bias sputtered CoCrTa/Cr films," IEEE Trans. Magn., vol. 29, pp 3676-3678 (1995).