NiAl Underlayers For CoCrTa Magnetic Thin Films

IEEE Transactions on Magnetics

Volumn 30, Issue 6, 1994, Pages 3951-3953

  Lambeth, David N ^b   Laughlin, David E ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b Department of Electrical and Computer Engineering ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT ALLOYS; COERCIVE FORCE; CORROSION RESISTANCE; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; EPITAXIAL GROWTH; GRAIN BOUNDARIES; MAGNETIC PROPERTIES; MAGNETIZATION; SPUTTER DEPOSITION; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLOGRAPHIC TEXTURE; ENERGY DISPERSIVE X RAY SPECTROSCOPY; MAGNETIC LAYER; REMANENT MAGNETIZATION; X RAY DIFFRACTION;

MAGNETIC THIN FILMS;

EID: 0028550056     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.333954     Document Type: Article

References (17)

1. S. Iwasaki, K. Ouchi and N. Honda, IEEE Trans. Magn., vol. 16, 1111 (1987).
2. D.J. Rogers, J.N. Chapman, J.P.C Bemards and S.B. Luitjens, IEEE Trans. Magn., 25,4180 (1989).
3. T. Yogi, C. Tsang, T.A. Nguyen, K. Ju, G.L. Gorman and G. Castillo, IEEE Trans. Magn., vol. 26, 2271 (1990).
4. K. E. Johnson, Proceedings of the Second International Symposium on Magnetic Materials, Processes, and Devices of the Electrochemical Society, vol. 92-10,27 (1991).
5. T. Lin, and T. Yamashita, IEEE Trans. Magn., vol. 24, 2700 (1988).
6. H. Suzuki, N. Tsumita, M. Hayashi, Y. Shiroishi and Y. Matsuda, IEEE Trans. Magn., vol. 26,2280 (1990).
7. Rajiv Ranjan, J. Appl. Phys., 67 (9), 4698 (1990).
8. T. Kogure. S. Katayama, and N. Ishii, J. Appl. Phys., 67 (9), 4701 (1990).
9. R. Ranjan, J. Chang, T. Yamashita and T. Chen, J. Appl. Phys.,73 (10), 5542 (1993).
10. T.A. Nguyen and J.K. Howard, J. Appl. Phys., 73 (10), 5579 (1993).
11. N. Tani, M. Hashimoto, Y. Murata, M. Ishikawa, Y. Ota, and K. Nakamura. J. Appl. Phys., 67 (12), 7507 (1990).
12. K. Hono, B. Wong and D.E. Laughlin, J. Appl. Phys., vol. 68, 4734 (1990).
13. R.D. Noebe, R.R. Bowman and M.V. Nathal, International Materials Rev., vol. 38, No. 4,193 (1993).
14. JCPDS diffraction data card, JCPDS, 1601 Park Lane, Swarthmore, Pennsylvania.
15. S.R. Butler, J.E. Hanlon and R.J. Wasilewski, J. Phys. Chem. Solids, vol. 30, 1929 (1969).
16. S.L. Duan, J.O. Artman, B. Wong and D.E. Laughlin, J. Appl. Phys., 67 (9), 4913 (1990).
17. Y. Deng, D.N. Lambeth, L.L. Lee and D.E. Laughlin, J. Appl. Phys., 73 (10), 6677 (1993).