Crystallographic structure of CoPtCr/CrV thin films as revealed by cross-section TEM and x-ray pole-figure analysis and its relevance to magnetic properties

Journal of Applied Physics

Volumn 73, Issue 10, 1993, Pages 5560-5562

  Parker, M A ^a   Howard, J K ^a   Ahlert, R ^a   Coffey, K R ^a  

^a IBM   (United States)

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EID: 36449000857     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.353650     Document Type: Article

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