The control of microstructural features of thin films for magnetic recording

Scripta Metallurgica et Materiala

Volumn 33, Issue 10-11, 1995, Pages 1525-1536

  Laughlin, David E ^a   Cheong, B ^a   Feng, Y C ^b   Lambeth, D N ^a   Lee, Li Lien ^a   Wong, Bunsen ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b Data Storage Systems Center Carnegie Mellon University ^*

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; GRAIN SIZE AND SHAPE; MAGNETIC PROPERTIES; MAGNETIC RECORDING; PERFORMANCE;

CRYSTALLOGRAPHIC TEXTURE; INTERLAYERS; UNDERLAYERS;

MAGNETIC THIN FILMS;

EID: 0029476348     PISSN: 0956716X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0956-716X(95)00394-B     Document Type: Article

References (23)

1. Effects of argon pressure and substrate heating on the chromium underlayer used for high-density longitudinal CoNiCr media
2. Microstructure and Recording Noise of Thin Film Longitudinal Media
3. Derivative Crystal Structures
4. Epitaxy and crystallographic texture of thin films for magnetic recording