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Volumn 45, Issue 3 PART 1, 1998, Pages 303-309
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Optimal p-stop pattern for the n-side strip isolation of silicon microstrip detectors
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
ELECTRIC CHARGE;
ELECTRIC FIELDS;
LASER APPLICATIONS;
MICROSTRIP DEVICES;
OPTIMIZATION;
SEMICONDUCTING SILICON;
SPURIOUS SIGNAL NOISE;
ACCUMULATION LAYER;
CHARGE COLLECTION EFFICIENCY;
LASER TEST STAND;
SILICON MICROSTRIP DETECTORS;
STOP PATTERN;
STRIP ISOLATION;
RADIATION DETECTORS;
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EID: 0032098867
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.682398 Document Type: Article |
Times cited : (23)
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References (10)
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