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Volumn 46, Issue 5 PART 2, 1998, Pages 623-631

Characteristics of trenched coplanar waveguide for high-resistivity si mmic applications

Author keywords

Capacitance; Conductance; CPW; Loss; MMIC

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRIC LINES; ELECTRIC LOSSES; ELECTRIC RESISTANCE; FINITE ELEMENT METHOD; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES;

EID: 0032074585     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.668674     Document Type: Article
Times cited : (33)

References (14)
  • 1
    • 0019689846 scopus 로고    scopus 로고
    • "Silicon as a millimeter-wave monolithically integrated substrate-A new look,"
    • vol. 42, pp. 633-660, 1981.
    • A. Rosen étal, "Silicon as a millimeter-wave monolithically integrated substrate-A new look," RCA Rev., vol. 42, pp. 633-660, 1981.
    • RCA Rev.
    • Rosen, A.1
  • 6
    • 0029491472 scopus 로고    scopus 로고
    • "Enhanced SiGe heterojunction bipolar transistors with 160 GHz-Fmax," in
    • 1995, pp. 743-746.
    • A. Schuppen and U. Erben étal.. "Enhanced SiGe heterojunction bipolar transistors with 160 GHz-Fmax," in IEDM. Washington, DC, Dec. 1995, pp. 743-746.
    • IEDM. Washington, DC, Dec.
    • Schuppen, A.1    Erben, U.2
  • 12
    • 84925794148 scopus 로고    scopus 로고
    • "Techniques for small-signal analysis of semiconductor devices,"
    • 32, pp. 2028-2037, Oct. 1985.
    • S. E. Laux, "Techniques for small-signal analysis of semiconductor devices," IEEE Trans. Electron Devices, vol. ED32, pp. 2028-2037, Oct. 1985.
    • IEEE Trans. Electron Devices, Vol. ED
    • Laux, S.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.