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Volumn 227-230, Issue PART 2, 1998, Pages 1277-1281

Limited influence of grain boundary defects in hot-wire CVD polysilicon films on solar cell performance

Author keywords

Grain boundary defects; Poly Si:H films; Solar cell

Indexed keywords

CARRIER CONCENTRATION; CHEMICAL VAPOR DEPOSITION; ELECTRON SPIN RESONANCE SPECTROSCOPY; GRAIN BOUNDARIES; INFRARED SPECTROSCOPY; PHOTOCONDUCTIVITY; SEMICONDUCTING POLYMERS; SEMICONDUCTING SILICON; SOLAR CELLS; THERMAL EFFECTS;

EID: 0032064297     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(98)00302-0     Document Type: Article
Times cited : (12)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.