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Volumn 452, Issue , 1997, Pages 1019-1024
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Temperature dependent line-shape of the silicon dangling bond EPR-resonance in polycrystalline silicon
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
CRYSTAL DEFECTS;
ELECTRIC PROPERTIES;
ELECTRONS;
GRAIN BOUNDARIES;
OPTICAL PROPERTIES;
PARAMAGNETIC RESONANCE;
POLYCRYSTALLINE MATERIALS;
TEMPERATURE;
DANGLING BOND;
ELECTRON HOPPING;
POLYCRYSTALLINE SILICON;
SEMICONDUCTING SILICON;
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EID: 0030710802
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (13)
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