Apertureless near-field optical microscopy: Influence of the illumination conditions on the image contrast

Applied Optics

Volumn 37, Issue 10, 1998, Pages 1814-1819

  Adam, Pierre Michel ^a   Royer, Pascal ^a   Laddada, Reda ^a   Bijeon, Jean Louis ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; COMPUTER SIMULATION; LIGHT POLARIZATION; LIGHT SCATTERING; MICROSCOPES; OPTICAL FIBERS; OPTICAL PROPERTIES; SURFACES;

APERTURELESS NEAR FIELD OPTICAL MICROSCOPY; INCIDENT LIGHT; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0032047845     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.001814     Document Type: Article

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