Development of a scanning near-field optical microscope with a probe consisting of a small spherical protrusion

Ultramicroscopy

Volumn 63, Issue 3-4, 1996, Pages 219-225

  Kataoka, T ^a   Endo, K ^a   Oshikane, Y ^a   Inoue, H ^a   Inagaki, K ^a   Mori, Y ^a   An, H ^b   Kobayakawa, O ^a   Izumi, A ^a  

^a OSAKA UNIVERSITY   (Japan)

^b OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC DISPERSION; EVAPORATION; LIGHT REFLECTION; MATHEMATICAL MODELS; PROBES; REFRACTIVE INDEX; SUBSTRATES;

EVANESCENT WAVES; SCANNING NEAR FIELD OPTICAL MICROSCOPE; TOTAL INTERNAL REFLECTION; VACUUM EVAPORATION;

OPTICAL MICROSCOPY;

METAL;

ARTICLE; MICROSCOPY;

EID: 0030199089     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00040-X     Document Type: Article

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