Momentum conservation for hot electrons at the Au/Si(111) interface observed by ballistic-electron-emission microscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 15, Issue 3, 1997, Pages 1358-1364

  Bell, L D ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION MICROSCOPY; INJECTED ELECTRONS; MEAN-FREE PATH; MOMENTUM CONSERVATIONS; MULTIPLE REFLECTIONS; ROOM TEMPERATURE; SPECTRAL SHAPES;

BALLISTICS; ELECTRONS; GOLD; HOT ELECTRONS; MOMENTUM; COMPUTATIONAL METHODS; ELECTRON MICROSCOPY; HOT CARRIERS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SEMICONDUCTING SILICON; THERMAL EFFECTS;

ELECTRON EMISSION; ELECTRON TRANSPORT PROPERTIES;

BALLISTIC ELECTRON EMISSION MICROSCOPY; HOT ELECTRONS; MOMENTUM CONSERVATION;

EID: 0031146543     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580589     Document Type: Article

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