Performance Trends in High-End Processors

Proceedings of the IEEE

Volumn 83, Issue 1, 1995, Pages 20-36

  Sai Halasz, George A ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CAPACITANCE; CMOS INTEGRATED CIRCUITS; DELAY CIRCUITS; ELECTRIC WIRING; INTEGRATED CIRCUIT LAYOUT; LOW TEMPERATURE ENGINEERING; PERFORMANCE; TECHNOLOGICAL FORECASTING;

FIRST ORDER CYCLE MODEL; HIGH END PROCESSORS; PERFORMANCE TRENDS;

MICROPROCESSOR CHIPS;

EID: 0029207481     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/5.362754     Document Type: Article

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