X-ray brilliance measurements of a subpicosecond laser plasma using an elliptical off-axis reflection zone plate

Journal of the Optical Society of America B: Optical Physics

Volumn 15, Issue 3, 1998, Pages 1235-1241

  Wilhein, T ^a   Altenbernd, D ^b   Teubner, U ^b   Forster E ^b   Hassner R ^b   Theobald, W ^b   Sauerbrey, R ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAMS; LASER PULSES; OPTICAL DEVICES; PHOTONS; PLASMAS; SPECTROGRAPHS;

ELLIPTICAL OFF AXIS REFLECTION ZONE PLATE; LASER PLASMA; X RAY BRILLIANCE MEASUREMENTS;

X RAYS;

EID: 0032023030     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.15.001235     Document Type: Article

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