Real time spectroellipsometry characterization of optical gap profiles in compositionally-graded semiconductor structures: Applications to bandgap engineering in amorphous silicon-carbon alloy solar cells

Journal of Applied Physics

Volumn 80, Issue 4, 1996, Pages 2420-2429

  Kim, Sangbo ^a   Burnham, J S ^a   Koh, Joohyun ^a   Jiao, Lihong ^b   Wronski, C R ^b   Collins, R W ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005309697     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363077     Document Type: Article

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