Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 775-780

  Kong, Fanping ^a   Kostecki, Robert ^a   McLarnon, Frank ^a   Muller, Rolf H ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Effective medium approximation; Electrochemical precipitation; Inhomogeneous films; Nickel hydroxide; Spectroscopic ellipsometry

Indexed keywords

APPROXIMATION THEORY; COATINGS; CURRENT DENSITY; DENSITY (SPECIFIC GRAVITY); ELECTROCHEMICAL ELECTRODES; ELLIPSOMETRY; MATHEMATICAL MODELS; NICKEL COMPOUNDS; PRECIPITATION (CHEMICAL); REDOX REACTIONS; SPECTROPHOTOMETRY;

EFFECTIVE MEDIUM APPROXIMATION; NICKEL HYDROXIDE; SPECTROSCOPIC ELLIPSOMETRY;

FILM GROWTH;

EID: 0031997438     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00994-2     Document Type: Article

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