Portable faraday cup for nonvacuum proton beams

IBM Journal of Research and Development

Volumn 40, Issue 1, 1996, Pages 73-76

  Ziegler, J F ^a,b,c   Saunders, P A ^a,d,e   Zabel, T H ^a,e,f,g  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b Mat Anal and Radiat Effects Group

^c IEEE

^d UNIVERSITY OF CONNECTICUT   (United States)

^e IBM   (United States)

^f RICE UNIVERSITY   (United States)

^g UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTROSTATICS; IONIZATION; MAGNETIC FIELDS; MEASUREMENTS; PARTICLE BEAMS; PROTONS; SPURIOUS SIGNAL NOISE;

ION CURRENTS; NONVACUUM PROTON BEAMS; PORTABLE FARADAY CUP;

ELECTROSTATIC DEVICES;

EID: 0029753150     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.401.0073     Document Type: Article

References (11)

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9. J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, T. J. O'Gorman, and J. M. Ross, "Accelerated Testing for Cosmic Soft-Error Rate," IBM J. Res. Develop. 40, 51 (1996, this issue). See extensive citations of nonvacuum analysis of VLSI parts.
10. B. G. Pearce, Health Hazards of VDTs, John Wiley & Sons, Inc., New York, 1984.
11. J. F. Ziegler, T. H. Zabel, and H. W. Curtis, Health Phys. 65, 252 (1993).