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Volumn 27, Issue 6, 1980, Pages 1485-1489

Single Event Upsets in RAMs Induced by Protons at 4.2 GeV and Protons and Neutrons below 100 MeV

Author keywords

[No Author keywords available]

Indexed keywords

NEUTRONS; PROTONS; RADIATION EFFECTS;

EID: 0019260258     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1980.4331056     Document Type: Article
Times cited : (26)

References (11)
  • 1
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    • Single Event Upset of Dynamic RAMs by Neutrons and Protons”
    • c. s. Guenzer, E. A. Wolicki and R. G. Allas, “Single Event Upset of Dynamic RAMs by Neutrons and Protons”, IEEE Trans. Nucl.  Sci. NS-26, 5048–5052 (1979).
    • (1979) IEEE Trans. Nucl. Sci , vol.NS-26 , pp. 5048-5052
    • Guenzer, C.S.1    Wolicki, E.A.2    Allas, R.G.3
  • 2
    • 0018586797 scopus 로고
    • Soft Errors Induced by Energetic Protons”
    • R. C. Wyatt et al., “Soft Errors Induced by Energetic Protons”, IEEE Trans. Nucl. Sci. NS-26, 4905-4910 (1979).
    • (1979) IEEE Trans. Nucl. Sci , vol.NS-26 , pp. 4905-4910
    • Wyatt, R.C.1
  • 3
    • 0000548070 scopus 로고
    • Energy Spectra of Nuclear Fragments Produced by High Energy protons”
    • G. D. Westfall et al., “Energy Spectra of Nuclear Fragments Produced by High Energy protons”, Phys. Rev 17, 1368–1381 (1978).
    • (1978) Phys. Rev , vol.17 , pp. 1368-1381
    • Westfall, G.D.1
  • 4
    • 84942842319 scopus 로고
    • Nuclear Reactions in Semiconductors”
    • July, Ithaca NY, IEEE Trans. Nucl. Sci., July, December
    • E. L. Petersen, “Nuclear Reactions in Semiconductors”,  IEEE Nuclear & Space Radiation Effects Conf., Ithaca NY, 15–18 July 1980, IEEE Trans. Nucl. Sci. NS-27 (December 1980).
    • (1980) IEEE Nuclear & Space Radiation Effects Conf. , vol.NS-27 , pp. 15-18
    • Petersen, E.L.1
  • 5
    • 0018554158 scopus 로고
    • Simulation of Cosmic Ray Induced Soft Errors and latchup in Integrated Circuit Computer Memories”
    • W. A. Kolasinski et al., “Simulation of Cosmic Ray Induced Soft Errors and latchup in Integrated Circuit Computer Memories”, IEEE Trans. Nucl. Sci. NS-26,  5087–5091 (1979).
    • (1979) IEEE Trans. Nucl. Sci , vol.NS-26 , pp. 5087-5091
    • Kolasinski, W.A.1
  • 6
    • 0019284731 scopus 로고
    • A Study of Single Event Upsets in Static RAM’s”
    • July, Ithaca NY, IEEE Trans. Nucl. Sci., July
    • W. E. Price, D. K. Nichols and K. A. Soliman, “A Study of Single Event Upsets in Static RAM’s”, IEEE Nuclear & Space Radiation Effects Conf., Ithaca NY, 15–18 July 1980, IEEE Trans. Nucl. Sci. NS-27 (December 1980).
    • (1980) IEEE Nuclear & Space Radiation Effects Conf. , vol.NS-27 , pp. 15-18
    • Price, W.E.1    Nichols, D.K.2    Soliman, K.A.3
  • 7
    • 0019243678 scopus 로고
    • Upset Phenomena Induced by Energetic Protons and Electrons”
    • July, Ithaca NY, IEEE Trans. Nucl. Sci., July
    • P. J. McNulty et al., “Upset Phenomena Induced by Energetic Protons and Electrons”, IEEE Nuclear & Space Radiation Effects Conf., Ithaca NY, 15–18 July 1980, IEEE Trans. Nucl. Sci. NS-27 (December 1980).
    • (1980) IEEE Nuclear & Space Radiation Effects Conf. , vol.NS-27 , pp. 15-18
    • McNulty, P.J.1
  • 8
    • 84932955223 scopus 로고
    • The Multiply Charged Primary Cosmic Radiation at Solar Minimum, 1965”
    • V. K. Balasubrahmanyan, “The Multiply Charged Primary Cosmic Radiation at Solar Minimum, 1965”, J. Geophys. Res. 71, 1771–1780 (1966).
    • (1966) J. Geophys. Res , vol.71 , pp. 1771-1780
    • Balasubrahmanyan, V.K.1
  • 9
    • 0018716817 scopus 로고
    • Effect of Cosmic Rays on Computer Memories
    • J. F. Ziegler and W. A. Lanford, “Effect of Cosmic Rays on Computer Memories”, Science 206, 776–788 (16 November 1979).
    • (1979) Science , vol.206 , pp. 776-788
    • Ziegler, J.F.1    Lanford, W.A.2
  • 10
    • 85003301349 scopus 로고
    • Shielding of Solar Cells against Van Allen Belt Protons”
    • C. A. Carosella, “Shielding of Solar Cells against Van Allen Belt Protons”, J. of Spacecraft & Rockets 5, 878–880 (1968).
    • (1968) J. of Spacecraft & Rockets , vol.5 , pp. 878-880
    • Carosella, C.A.1
  • 11
    • 0018331014 scopus 로고
    • Alpha-Particle-Induced Soft Errors in Dynamic Memories”
    • T. C. May and M. H. Woods, “Alpha-Particle-Induced Soft Errors in Dynamic Memories”, IEEE Trans. Elec. Dev. ED-26, 2–9 (1979).
    • (1979) IEEE Trans. Elec. Dev , vol.ED-26 , pp. 2-9
    • May, T.C.1    Woods, M.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.